SPC Press Release!

A Major New Book by Donald J. Wheeler

EMP III - Using Imperfect Data

Want to read an excerpt from this new book? Here's a link for your convenience.

Four Ways We Use Measurements

At 316 pages, EMP III…Using Imperfect Data is much more than a new edition of Evaluating the Measurement Process— rather it is a major new book. While EMP III expands and updates the classic procedures, it also goes beyond these procedures to include the explanations of why the procedures work. In addition, it includes a new way of characterizing measurement systems and provides illustrations of problems with the traditional techniques.

Nearly 30 Reasons you need EMP III

• Your data are less than perfect.
• Your data are never going to be perfect.
• You need to quit messing with the measurement system and get the job done!

With EMP III: Using Imperfect Data you can:

• Learn how to do an Honest Gauge R&R Study
• Learn how to characterize each application of a measurement system as either a First, Second, Third, or Fourth Class Monitor
• Learn how to determine the appropriate number of digits to record for any measurement
• Discover the difference between Observational Studies and Experimental Studies and the different types of analyses used for each
• Learn how to place Censored Data on a Process Behavior Chart
• Learn how some measurement system applications will only let you detect process deterioration while others will let you detect both deterioration and improvement
• Learn how to distinguish between four different ways we use measurements
• Learn how to use a Consistency Chart to…
• track a measurement system
• characterize measurement uncertainty
• check for bias in the measurements
• Learn how to evaluate destructive tests
• Learn how to use Consistency Charts with Subjective Measurements
• Discover what each of the values produced by a traditional Gauge R&R Study actually represents
• Discover why the Probable Error defines the effective resolution of a measurement
• Learn how Chunky Data affects the charts
• Learn how using the appropriate measurement increment can eliminate the problems of Chunky Data
• Learn how to use multiple determinations in Short EMP Studies
• Discover the four different paths through a Basic EMP Study, using the new Flowchart
• Incorporate ANOME and ANOMR techniques into your Basic EMP Study
• Benefit from new guidelines for assessing the parallelism in EMP Studies
• Learn how to do Two-Factor EMP Studies with nuisance components that are crossed or nested
• Discover the full explanation of the basis for manufacturing specifications
• Benefit from new explanations of the problems of Prediction and Representation
• Discover the role and scope of Acceptance Sampling
• Learn how to use the concept of a Grand Lot

With 64 examples, 40 data tables, plus eight appendicies containing 25 reference tables and three worksheets, this book is a complete, practical guide for understanding the uses and limitations of any physical measurement system.

In short, EMP III is a book that will enable you to use imperfect data to characterize and improve your operations and processes. Those with perfect data may not need this book, but everyone else does!

Our First Public seminar in 2006…

Understanding Statistical Process Control

…SPC for Manufacturing and Process Industries

March 27 – 30, 2006 - Knoxville, Tennessee - Taught by Dr. Donald J. Wheeler

Only $1495.00 per person - group rates available.
Price includes all books and materials, continental breakfasts, and lunches..

For more information, click here.
To Register Online, click here.

Participants in the last seminar told us…

• "Removes the fog! Very clearly explained.”
• "I learned more in four days than in some full academic courses!”
• "The class cleaned up a lot of questions, opened my eyes to other issues, and will go a long way in making me more productive.”
• "My goal was to gain a good understanding of SPC and the course accomplished this.”
• "Very practical.”